HOME    »    PROGRAMS/ACTIVITIES    »    Annual Thematic Program
Talk Abstract
Perspectives on RF Integrated Circuit Noise Analysis: Part I: Industrial Experiences with Noise Analysis in RF Circuits

Joel Phillips
Cadence Berkeley Labs

We will present some experiences in developing industrial tools for noise analysis of RF circuits. First we will discuss our experiences with commonly available noise models -- how they are used in commercial simulators, their limitations, and future needs of the EDA industry in this area. Next we will present some of the results of efforts to encapsulate understanding of the noise processes found in RF circuits in ways that can be used by RF designers to improve their circuit performance.

Modeling and Analysis of Noise in Integrated Circuits and Systems

"IMA "Hot Topics" Workshops

Connect With Us: