Campuses:

inverse scattering

Monday, April 29, 2019 - 10:10am - 11:00am
John Schotland (University of Michigan)
We propose a method to reconstruct the optical properties of a scattering medium with subwavelength resolution. The method is based on the solution to the inverse scattering problem with internal sources. Applications to photoactivated localization microscopy are described.
Wednesday, February 15, 2017 - 9:00am - 9:50am
David Colton (University of Delaware)
In many problems in nondestructive testing, imaging is not a practical method for detecting flaws. An example of this is the nondestructive testing of airplane canopies in which the absorbing anisotropic material is degraded through prolonged exposure to ultraviolet radiation. In cases such as this, the use of target signatures (if they exist!) may present an alternative to imaging. In this talk we consider the situation when small changes in the (possibly complex valued) index of refraction are to be determined from changes in the measured far field (or near field) data.
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