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Monday, October 14, 2019 - 10:00am - 10:45am
Vivek Goyal (Boston University)
Single-photon lidar systems form range and reflectivity images using detectors with single-photon sensitivity. Some focused ion beam (FIB) and electron microscopy systems use direct detection of secondary electrons to maximize resolution. This talk will discuss recent results on the interpretation of single-photon and single-electron data that yield improved mitigation of detector dead time and a principle for dose reduction in FIB microscopy with no degradation of image quality.
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