Campuses:

<b>Hierarchical Testing</b><br><br/><br/><span class=iblue>Advocates:</span> Rehg, Geman<br><br/><br/><span class=iblue>Critics:</span> Hebert, Freeman

Tuesday, May 23, 2006 - 3:00pm - 5:00pm
EE/CS 3-180
William Freeman (Massachusetts Institute of Technology), Donald Geman (Johns Hopkins University), Martial Hebert (Carnegie-Mellon University), James Rehg (Georgia Institute of Technology)