Diffraction Tomography Using Intensity Measurements

Monday, January 9, 2006 - 3:30pm - 4:00pm
EE/CS 3-180
Mark Anastasio (Illinois Institute of Technology)
Diffraction tomography (DT) is a well-established imaging method
for determination of the complex-valued refractive index
distribution of a weakly scattering object.
The success of DT imaging in optical applications, however, has been limited
because it requires explicit knowledge of the phase of the measured wavefields.
To circumvent the phase-retrieval problem, a
theory of intensity DT (I-DT) has been proposed that
replaces explicit phase measurements on a single detector plane
by intensity measurements on two or more different parallel planes.
In this work, we propose novel I-DT reconstruction
theories that are applicable to non-conventional scanning geometries.
Such advancements can improve the effectiveness of existing
imaging systems and, perhaps more importantly, prompt and
facilitate the development of systems for novel applications.
Numerical simulations are conducted to demonstrate and validate
the proposed tomographic reconstruction algorithms.