Perspectives on RF Integrated Circuit Noise Analysis: Part I: Industrial Experiences with Noise Analysis in RF Circuits

Tuesday, August 29, 2000 - 3:20pm - 3:55pm
Keller 3-180
Joel Phillips (Cadence Design Systems)
We will present some experiences in developing industrial tools for noise analysis of RF circuits. First we will discuss our experiences with commonly available noise models -- how they are used in commercial simulators, their limitations, and future needs of the EDA industry in this area. Next we will present some of the results of efforts to encapsulate understanding of the noise processes found in RF circuits in ways that can be used by RF designers to improve their circuit performance.