Main navigation | Main content

HOME » PROGRAMS/ACTIVITIES » Annual Thematic Program

PROGRAMS/ACTIVITIES

Annual Thematic Program »Postdoctoral Fellowships »Hot Topics and Special »Public Lectures »New Directions »PI Programs »Industrial Programs »Seminars »Be an Organizer »Annual »Hot Topics »PI Summer »PI Conference »Applying to Participate »

Talk Abstract

Seminar on Industrial Problems

Time-Varying Speckle Patterns, and Application to Laser Scanners

Seminar on Industrial Problems

Time-Varying Speckle Patterns, and Application to Laser Scanners

February 18, 2000

Presented
by:

** Sasa Kresic **

Symbol Corporation

kresic@symbol.com

10:10 am

A speckle pattern is a random interference pattern which is formed when a highly coherent beam is scattered from a rough surface. As the beam scans across the surface the speckle pattern changes in time giving rise to random fluctuations in the current of a photodetector which collects the scattered light. This phenomenom is called speckle noise, and is of great importance in laser scanning devices such as barcode readers. The purpose of this talk is to present the mathematical model of Gaussian speckle patterns, and to explain how the theory of random processes can be used in studying spectral properties of speckle noise. In particular, we will show how an application of the Wiener-Khinchine theorem yields the distribution of the noise power in the frequency domain. We shall also discuss the signal-to-noise ratio (SNR) when the scanning beam moves across a surface of nonuniform reflectance. We will derive estimates for the lower bound of SNR for some simple reflectance functions, and explain the implications of this to laser barcode scanning.

Collaborators: Prof. E. Marom, Tel Aviv University and Prof. L. Bergstein, Brooklyn Politechnic.

Back to 1999-2000 Seminars on Industrial Problems